Welcome back to another episode of Sentry’s Snack of the Week.
In the monitoring industry there’s a complicated and frustrating conversation that persisted over the years: how do you deal with the enormous volume of data generated by instrumentation? On one side of the aisle, you will find a cohort of vendors and developers telling you that you have to sample data, followed immediately by another group telling you that sampling will ruin the accuracy of incident analysis. They’re both right.
Read more about dynamic sampling on our blog.
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Director of DevRel, Sentry